GAMMA-IRRADIATION OF ALUMINUM OXIDE Al2O3 AND ITS FEATURES DETECTED BY POWDER DIFFRACTOMETRY

Kosimov I.O.; Hojiyev Sh.T.; Gaibnazarov B.B.; Makhmudov M.A.

doi:10.5281/zenodo.7541952

GAMMA-IRRADIATION OF ALUMINUM OXIDE Al2O3 AND ITS FEATURES DETECTED BY POWDER DIFFRACTOMETRY

16.01.2023 International Scientific Journal "Science and Innovation". Series A. Volume 2 Issue 1

Kosimov I.O., Hojiyev Sh.T., Gaibnazarov B.B., Makhmudov M.A.

Abstract. X-ray diffraction analysis of materials is a standard method for phase identification and characterization of polycrystalline materials [1]. Experimentally, various peaks were detected in the X-ray phase analysis (XRD) spectra of aluminum oxide Al2O3 samples. Based on the data (XRD) of samples of aluminum oxide Al2O3 obtained for sample with different modes of powder production, Miller indices and lattice parameters were determined. The experimental data obtained are in good agreement with the data obtained by other methods.

Keywords: gamma irradiation, aluminum oxide, powder, wide-gap semiconductor, Miller indices, microstructure.

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