REVERSIBLE MEDIUM FOR RECORDING AND STORING INFORMATION BASED ON VANADIUM DIOXIDE V2O5

Gaibnazarov B.B.; Tursunov M.A.; Tajibaev A.T.; Khojiev Sh.T.,  Kosimov I.O

doi:10.5281/zenodo.7541666

Gaibnazarov B.B., Tursunov M.A., Tajibaev A.T., Khojiev Sh.T., Kosimov I.O

Abstract. X-ray diffraction analysis of materials is a standard method for phase identification and characterization of polycrystalline materials [1]. Experimentally, various peaks were detected in the X-ray phase analysis (XRD) spectra of vanadium penta oxide V2O5. Based on the data (XRD) of sample of vanadium penta oxide V2O5 obtained for samples with different modes of powder production, Miller indices and lattice parameters were determined. The experimental data obtained are in good agreement with the data obtained by other methods.

Keywords: vanadium penta oxide, powder, wide-gap semiconductor, Miller indices, microstructure.

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